[1]
Information on http: /www. rohsguide. com.
Google Scholar
[2]
J. A. Brusse, G. J. Ewell and J. P. Siplon, Tin whiskers: Attributes and mitigation, CARTS Europe 2002. 16th Passive Components Symposium, pp.221-233.
Google Scholar
[3]
H. Moriuchi, Y. Tadokoro, M. Sato, T. Furusawa and N. Suzuki, Microstructure of external stress whiskers and mechanical indentation test method, J. Electronic Mater., 36 (2007) 220- 225.
DOI: 10.1007/s11664-006-0030-3
Google Scholar
[4]
K. Suganuma, Research trends of tin whiskers and current understanding of the mechanism, J. Surface Finishing Society of Japan, 59 (2008) 210-217. (in Japanese).
Google Scholar
[5]
U. Lindborg, A model for the spontaneous growth of zinc, cadmium and tin whiskers, Acta Metallur. 24(1976) 181-186.
DOI: 10.1016/0001-6160(76)90021-3
Google Scholar
[6]
Y. Nakadaira, S. Jeong, J. Shin, J. Seo, S. Min t. Cho, S. Kang and S. Oh, Growth of tin whiskers for lead-free plated leadframe packages in high humid environments and during thermal cycling, Microelectronics Reliability 48 (2008) 83-104.
DOI: 10.1016/j.microrel.2007.01.091
Google Scholar
[7]
C. Xu, Y. Zhang, C. Fan and J.A. Abys, Driving force for the formation of Sn whiskers: Compressive stress - Pathways for its generation and remedies for elimination and minimization, IEEE Trans Electronics Packaging Manufacturing, 28 (2005) 31-35.
DOI: 10.1109/tepm.2005.846461
Google Scholar
[8]
S-B. Li, G-P. Bei, H-X. Zhai, Z-L. Zhang, Y. Zhou and C-W. Li, The origin of driving force for the formation of Sn whiskers at room temperature, J. Mater. Res., 22 (2007) 3226-3232.
DOI: 10.1557/jmr.2007.0402
Google Scholar
[9]
J. Smetana, Theory of tin whisker growth: The End Game, IEEE Transaction on Electr. Pack. Manuf., 30 (2007) 11-22.
Google Scholar
[10]
N. Kuwano, A. Jinnouchi, S. Horikami, N. Hirokado and H. Sosiati, Effects of post-plating reflow on changes in crystal grain size of Sn-2mass% Bi alloy plating with thermal cycling treatment, Mater. Transactions, 51 (2010) 1741-1746.
DOI: 10.2320/matertrans.mj201021
Google Scholar
[11]
M. Lias and N. Kuwano, Preparation and deformation of tin single crystal, Proceedings of the MJIIT-JUC Joint International Symposium 2013, Hiratsuka, Japan Nov. 6-8 (2013) MP-034.
Google Scholar
[12]
N. Kuwano, S. Horikami, M. Maeda and H. Sosiati, TEM and SEM analysis for formation mechanism of tin whiskers, Adv. Mater. Res. 545 (2012) 16-20.
DOI: 10.4028/www.scientific.net/amr.545.16
Google Scholar
[13]
L. Sauter, A. Seekamo, Y. Shibata, Y. Kanameda and H. Yamashita, Whisker mitigation measures for Sn-plated Cu for different stress tests, Microelectronics Reliability, 50 (2010) 1631-1635.
DOI: 10.1016/j.microrel.2010.07.083
Google Scholar
[14]
P. T. Vianco and J. A. Rejent, Dynamic recrystallization (DRX) as the mechanism for Sn whisker development. Part 1; A model, J. Electronic Mater., 38 (2009) 1815-1825.
DOI: 10.1007/s11664-009-0879-z
Google Scholar