DIELECTRIC MEASUREMENTS FOR LOW-LOSS MATERIALS USING TRANSMISSION PHASE-SHIFT METHOD
DOI:
https://doi.org/10.11113/jt.v77.6286Keywords:
Rectangular waveguides, dielectric constant, loss factor, transmission phase-shift, sample thicknessAbstract
This paper presents a calculation of the dielectric properties of low-loss materials using the transmission phase-shift method. This method can provide calibration-independent and position-insensitive features, and it was verified experimentally by measuring several well-known samples using X-band rectangular waveguides.
References
A. M. Nicolson, G. F. Ross. 1970. Measurement Of The Intrinsic Properties Of Materials By Time-Domain Techniques. IEEE Trans. Instrum. Meas. 19(4): 377-382.
W. B. Weir. 1974. Automatic Measurement Of Complex Dielectric Constant And Permeability At Microwave Frequencies. Proc. IEEE. 62(1): 33-36.
J. Baker-Jarvis, E. J. Vanzura, W. A. Kissick. 1990. Improved Technique For Determining Complex Permittivity With The Transmission/Reflection Method. IEEE Trans. Microwave Theory Tech. 38(8): 1096-1103.
A. H. Boughriet, C. Legrand, A. Chapoton. 1997. Noniterative Stable Transmission/Reflection Method For Low-Loss Material Complex Permittivity Determination. IEEE Trans. Microwave Theory Tech. 45(1): 52-57.
O. Luukkonen, S. I. Maslovski, S. A. Tretyakov. 2011. A Stepwise Nicolson-Ross-Weir-Based Material Parameter Extraction Method. IEEE Antennas and Wireless Propagation Letters. 10: 1295-1298.
K. Sarabandi, F. T. Ulaby. 1988. Technique For Measuring The Dielectric Constant Of Thin Materials. IEEE Trans. Instrum. Meas. 37(4): 631-636.
B. K. Chung. 2007. Dielectric Constant Measurement For Thin Material At Microwave Frequencies. Progress in Electromagnetics Research. 75: 239-252.
L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, V. K. Varadan. 2004. Microwave Electronics (Measurement and Materials Characterization). U. K: John Wiley & Sons, Ltd : 175-203.
J. Sheen. 2009. Comparisons Of Microwave Dielectric Property Measurements By Transmission/Reflection Techniques And Resonance Techniques (Topical Review). Meas. Sci. Technol. 20: 1-12.
U. C. Hasar. 2008. A New Calibration-Independent Method For Complex Permittivity Extraction Of Solid Dielectric Material. IEEE Microw. Wireless Compon. Lett. 18(12): 788-790.
K. Chalapat, K. Sarvala, J. Li, G. S. Paraoanu. 2009. Wideband Reference-Plane Invariant Method For Measuring Electromagnetic Parameters Of Materials. IEEE Trans. Microwave Theory Tech. 57(9): 2257-2267.
Z. Caijun, J. Quanxing, J. Shenhui. 2011. Calibration-Independent And Position-Insensitive Transmission/Reflection Method For Permittivity Measurement With One Sample In Coaxial Line. IEEE Trans. Electromagn. Compat. 53(3): 684-689.
MathWorks. 2013. Documentation Center [Documentation Search].Available:http://www.mathworks.com/help/matlab/ref/unwrap.html.
Agilent 85071 Materials Measurement Software Technical Overview. 2012. UK: Agilent Technologies Inc.
ECCOSTOCK. (R) Low Loss Dielectrics & Other Common Materials. Dielectric Materials Chart. Available: http://www.eccosorb.eu/sites/default/files/files/dielectric-chart.pdf.
D. K. Ghodgaonkar, V. V. Varadan, V. K. Varadana. 1989. Free-Space Method For Measurement Of Dielectric Constants And Loss Tangents At Microwave Frequencies. IEEE Trans. Instrum. Meas. 37(3): 789-793.
Hitachi Chemical Co. Ltd. Low Transmission Loss Multi-Layer Material for High-Speed & High-Frequency Applications. Available:http://www.ieee802.org/3/bj/public/nov11/ikeda_01_1111.pdf.
K. Y. You, Z. Abbas, M. F. A. Malek and E. M. Cheng. 2014. Non-Destructive Dielectric Measurements And Calibration For Thin Materials Using Waveguide-Coaxial Adaptors â€. Measurement Science Review. 14(1): 16-24.
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