Electronic properties of multiple adjacent δ-doped Si:P layers: The approach to monolayer confinement

A. Budi, D. W. Drumm, M. C. Per, A. Tregonning, S. P. Russo, and L. C. L. Hollenberg
Phys. Rev. B 86, 165123 – Published 16 October 2012

Abstract

Recent breakthroughs in single-atom fabrication in silicon have brought the exciting prospect of monolayer-based nanoelectronics and theoretical understanding of such systems into sharp focus. Of particular interest is the effect of such sharp two-dimensional Coulomb array confinement on electronic properties of these donor-based semiconducting systems such as valley splitting, which is critical to quantum electronic applications. In this paper we apply ab initio techniques to these high-density donor systems specifically in order to investigate the approach to monolayer confinement. An optimized basis set is developed for Si:P and validated against our previous work on single δ-doped layers. A systematic study is then conducted wherein the effect of multiple adjacent phosphorus δ layers on the electronic properties of the material is explored. We find nonmonotonic electronic behavior as we approach the monolayer confinement limit, with potentially far-reaching implications for large-scale fabrication techniques.

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  • Received 22 April 2012

DOI:https://doi.org/10.1103/PhysRevB.86.165123

©2012 American Physical Society

Authors & Affiliations

A. Budi1,*, D. W. Drumm1, M. C. Per2, A. Tregonning1, S. P. Russo2, and L. C. L. Hollenberg1

  • 1School of Physics, The University of Melbourne, Parkville, VIC 3010, Australia
  • 2School of Applied Sciences, RMIT University, Melbourne, VIC 3001, Australia

  • *abudi@unimelb.edu.au

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Vol. 86, Iss. 16 — 15 October 2012

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