Abstract
The thermoelectric figure of merit (zT) can be increased by introduction of additional interfaces in the bulk to reduce the thermal conductivity. In this work, PbTe with a dispersed indium (In) phase was synthesized by a matrix encapsulation technique for different In concentrations. x-Ray diffraction analysis showed single-phase PbTe with In secondary phase. Rietveld analysis did not show In substitution at either the Pb or Te site, and this was further confirmed by room-temperature Raman data. Low-magnification (~1500×) scanning electron microscopy images showed micrometer-sized In dispersed throughout the PbTe matrix, while at high magnification (150,000×) an agglomeration of PbTe particles in the hot-pressed samples could be seen. The electrical resistivity (ρ) and Seebeck coefficient (S) were measured from 300 K to 723 K. Negative Seebeck values showed all the samples to be n-type. A systematic increase in resistivity and higher Seebeck coefficient values with increasing In content indicated the role of PbTe-In interfaces in the scattering of electrons. This was further confirmed by the thermal conductivity (κ), measured from 423 K to 723 K, where a greater reduction in the electronic as compared with the lattice contribution was found for In-added samples. It was found that, despite the high lattice mismatch at the PbTe-In interface, phonons were not scattered as effectively as electrons. The highest zT obtained was 0.78 at 723 K for the sample with the lowest In content.
Similar content being viewed by others
References
Z.H. Dughaish, Phys. B 322, 205 (2002).
A.D. LaLonde, Y. Pei, and G.J. Snyder, Energy Environ. Sci. 4, 2090 (2011).
Y. Pei, A.D. LaLonde, N.A. Heinz, and G.J. Snyder, Adv. Energy Mater. 2, 670 (2012).
Y. Pei, H. Wang, Z.M. Gibbs, A.D. LaLonde, and G.J. Snyder, NPG Asia Mater. 4, e28 (2012).
D.M. Rowe and V.S. Shukla, J. Appl. Phys. 52, 7421 (1981).
Q. Meng, L. Wu, and Y. Zhu, Phys. Rev. B 87, 064102 (2013).
J. He, J.R. Sootsman, S.N. Girard, J.C. Zheng, J. Wen, Y. Zhu, M.G. Kanatzidis, and V.P. Dravid, J. Am. Chem. Soc. 132, 8669 (2010).
T. Ikeda, E.S. Toberer, V.A. Ravi, S.M. Haile, and G.J. Snyder, Proceedings of International Conference on Thermoelectrics (2007). doi:10.1109/ICT.2007.4569408.
J.E. Douglas, C.S. Birkel, M. Miao, C.J. Torbet, D.D. Stucky, T.M. Pollock, and R. Seshadri, Appl. Phys. Lett. 101, 183902 (2012).
J.R. Sootsman, R.J. Pcionek, H. Kong, C. Uher, and M.G. Kanatzidis, Chem. Mater. 18, 4993 (2006).
F. Cerrina, R.R. Daniels, T. Zhao, and V. Fano, J. Vac. Sci. Technol. B 1, 1983 (570).
F. Cerrina, R.R. Daniels, and V. Fano, Appl. Phys. Lett. 43, 182 (1983).
T. Roisnel and J. Rodriguez-Carvajal, Mater. Sci. Forum 118, 378 (2000).
P.C. Millett, R.P. Selvam, S. Bansal, and A. Saxena, Acta Mater. 53, 3671 (2005).
Y. Wada and S. Nishimatsu, J. Electrochem. Soc. Solid State Tech. 125, 1499 (1978).
F.J. Humphreys and M. Hatherley, Recrystallisation and Related Annealing Phenomena, 2nd ed. (Oxford: Elsevier, 2004), pp. 309, 306.
H. Wu, C. Cao, J. Si, T. Xu, H. Zhang, H. Wu, J. Chen, W. Shen, and N. Dai, J. Appl. Phys. 101, 103505 (2007).
N. Romcevic, Z.V. Popovic, and D.R. Khokhlov, J. Phys.: Condens. Mater. 7, 5105 (1995).
A.K. Sood, R. Gupta, P. Metcalf, and J.M. Honig, Phys. Rev. B 65, 104430 (2002).
S. Guo, Z. Du, and S. Dai, Phys. Stat. Sol. (B) 246, 2329 (2009).
T.A. Smorodina and A.P. Tsuranov, JETP Lett. 34, 75 (1981).
Z. Dashevsky, S. Shusterman, M.P. Dariel, and I. Drabkin, J. Appl. Phys. 92, 1425 (2002).
D.M. Freik, V.Ì. Boychuk, and L.I. Mezhylovsjka, Semicond. Phys. Quantum Electron. Optoelectron. 6, 454 (2003).
T. Su, X. Jia, H. Ma, J. Guo, Y. Jiang, N. Dong, L. Deng, X. Zhao, T. Zhu, and C. Wei, J. Alloys Compd. 468, 410 (2009).
Y. Pei, X. Shi, A. LaLonde, H. Wang, L. Chen, and G.J. Snyder, Nature 473, 66 (2011).
Ch. Papageorgiou, J. Giapintzkis, and Th. Kyrats, J. Electron. Mater. (2013). doi:10.1007/s11664-012-2469-8.
F. Stern and W.D. Howard, Phys. Rev. 163, 816 (1967).
F. Gather, C. Heiliger, and P.J. Klar, J. Phys. D: Condens. Mater. 23, 335301 (2011).
M. Guch, C.R. Sankar, J. Salvador, G. Meisner, and H. Kleinke, Sci. Adv. Mater. 3, 615 (2011).
R. Dalven, J. Appl. Phys. 38, 1732 (1967).
Y. Gelbstein, Z. Dashevsky, and M.P. Dariel, Phys. B 363, 196 (2005).
Z. Dashevsky, R. Kreizman, and M.P. Dariel, J. Appl. Phys. 98, 094309 (2005).
I.I. Fishchuk, Phys. Stat. Sol. (B) 196, K25 (1996).
M. Bartkowiak and G.D. Mahan, Recent Trends in Thermoelectric Materials-II, Semiconductors & Semimetals (San Diego: Academic, 2001).
M.D. Losego, M.E. Grady, N.R. Sottos, D.G. Cahill, and P.V. Braun, Nat. Mater. 11, 502 (2012).
A. Bali, E. Royanian, E. Bauer, P. Rogl, and R.C. Mallik, J. Appl. Phys. 113, 123707 (2013).
M. Romcevic, N. Romcevic, D.R. Khokhlov, and I.I. Ivanchik, J. Phys. Condens. Mater. 12, 8737 (2000).
A.H. Romero, M. Cardona, R.K. Kremer, R. Lauck, G. Siegle, J. Serrano, and X.C. Gonze, Phys. Rev. B 78, 224302 (2008).
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Bali, A., Kim, IH., Rogl, P. et al. Thermoelectric Properties of Two-Phase PbTe with Indium Inclusions. J. Electron. Mater. 43, 1630–1638 (2014). https://doi.org/10.1007/s11664-013-2819-1
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11664-013-2819-1