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Characterizing Grain-Oriented Silicon Steel Sheet Using Automated High-Resolution Laue X-ray Diffraction

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Abstract

Controlling texture in grain-oriented (GO) silicon steel sheet is critical for optimization of its magnetization performance. A new automated laboratory system, based on X-ray Laue diffraction, is introduced as a rapid method for large scale grain orientation mapping and texture measurement in these materials. Wide area grain orientation maps are demonstrated for both macroetched and coated GO steel sheets. The large secondary grains contain uniform lattice rotations, the origins of which are discussed.

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References

  1. N.P. Goss: U.S. Patent No. 1,965,559, 1933.

  2. D.E. Stott and W.B. Hutchinson: Proc. 3rd Eur. Colloquium on Textures, Pont-à-Mousson, 1973, pp. 427–38.

  3. M. Frommert, C. Zobrist, L. Lahn, A. Böttcher, D. Raabe, and S. Zaefferer: in Materials Processing and Texture, A.D. Rollett, ed., 2008, pp. 143–50.

  4. S. Zaefferer: Mater. Sci. Forum, 2005, vols. 495–497, pp. 3–12.

    Article  Google Scholar 

  5. Y. Ushigami, Y. Suga, N. Takahashu, K. Kawasaki, Y. Chikaura, and H. Kii: J. Mater. Eng., 1999, vol. 13, pp. 113–18.

    Article  Google Scholar 

  6. H.-S. Shim, T.-W. Na, J.-S. Chung, S.-B. Kwon, K. Gil, J.-T. Park, and N.-M. Hwang: Scripta Mater., 2016, vol. 16, pp. 71–75.

    Article  Google Scholar 

  7. D.S. Dorner, L. Lahn, and S. Zaefferer: Mater. Sci. Forum, 2004, vols. 467–470, pp. 129–34.

    Article  Google Scholar 

  8. N.-M. Hwang: J. Mater. Sci., 1998, vol. 33, pp. 5625–29.

    Article  Google Scholar 

  9. P.A. Lynch, A.W. Stevenson, D. Liang, D. Parry, S. Wilkins, and N. Tamura: Rev. Sci. Instrum., 2007, vol. 78, p. 023904.

    Article  Google Scholar 

  10. P.A. Lynch, A.W. Stevenson, and M.R. Barnett: in preparation.

  11. N. Tamura: in Microdiffraction Analysis of Local and Near Surface Hierarchical Organization of Defects, R. Barabash and G. Ice, eds., Imperial College Press, London, 2013, pp. 1–42.

  12. L. Ryde, B. Hutchinson, and T. Kumano: Mater. Sci. Forum, 2004, vols. 467–470, pp. 739–44.

    Article  Google Scholar 

  13. W.B. Hutchinson, E. Lindh, and P. Bate: Proc. 12th Int. Conf. Textures Mater., Montreal, PQ, Canada, J.A. Szpunar, ed., 1999, pp. 34–39.

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We acknowledge John Vella (Deakin University) and David Fox (CSIRO) for their significant contributions. Cogent Power Ltd. supplied the materials for the lattice curvature measurements.

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Authors and Affiliations

  1. Institute for Frontier Materials, Deakin University, Geelong, VIC, 3217, Australia

    Peter Lynch & Matthew Barnett

  2. CSIRO Manufacturing, Private Bag 10, Clayton South, 3169, VIC, Australia

    Andrew Stevenson

  3. SwereaKIMAB, Box 7047, 16407, Kista, Sweden

    Bevis Hutchinson

Authors
  1. Peter Lynch
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  2. Matthew Barnett
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  3. Andrew Stevenson
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  4. Bevis Hutchinson
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Correspondence to Bevis Hutchinson.

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Manuscript submitted February 22, 2017.

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Lynch, P., Barnett, M., Stevenson, A. et al. Characterizing Grain-Oriented Silicon Steel Sheet Using Automated High-Resolution Laue X-ray Diffraction. Metall Mater Trans A 48, 5206–5210 (2017). https://doi.org/10.1007/s11661-017-4313-5

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  • DOI: https://doi.org/10.1007/s11661-017-4313-5

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