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Investigation of Verification Artifacts in WR-03 Waveguides

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Abstract

This paper presents an investigation of verification artifacts in WR-03 waveguides. The waveguide verification artifacts include a cross-guide and a custom-made circular iris section. The investigation involves the transmission loss uncertainty analysis of the verification artifacts for vector network analyzer (VNA) waveguide systems operating at millimeter wavelengths. The measurement errors due to the dimensional tolerances and the flange misalignment are predicted by using a commercially available electromagnetic software package. The data analysis is carried out for complex-valued scattering parameters (S-parameters). The uncertainty due to different error sources is computed according to the Law of Propagation of Uncertainty. The real and imaginary data along with the associated uncertainties are converted to magnitude and phase representation via linear propagation of uncertainties. The experimental results are also compared with simulated results.

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Acknowledgements

This work has been funded through the European Metrology Research Programme (EMRP) Project SIB62 Metrology for New Electrical Measurement Quantities in High-frequency Circuits. The EMRP is jointly funded by the EMRP participating countries within EURAMET and the European Union.

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Authors and Affiliations

  1. Nanoscience and Materials Division, National Institute of Metrological Research (INRiM), Strada delle cacce 91, Torino, ITALY

    Nosherwan Shoaib, Marco Sellone & Luciano Brunetti

  2. High Frequency and Electromagnetic Fields, Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116, Braunschweig, Germany

    Karsten Kuhlmann & Rolf Judaschke

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  1. Nosherwan Shoaib
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  2. Karsten Kuhlmann
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  3. Rolf Judaschke
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  4. Marco Sellone
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  5. Luciano Brunetti
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Correspondence to Nosherwan Shoaib.

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Shoaib, N., Kuhlmann, K., Judaschke, R. et al. Investigation of Verification Artifacts in WR-03 Waveguides. J Infrared Milli Terahz Waves 36, 1089–1100 (2015). https://doi.org/10.1007/s10762-015-0193-1

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  • DOI: https://doi.org/10.1007/s10762-015-0193-1

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